Ion optics of multiple-reflection time-of-flight mass analyzers for mass measurement and separation of rare isotopes

26.06.2019 – FLNR Scientific Seminar, 15-30, Flerov Lab Conference Hall.
M.I.Yavor, Institute for Analytical Instrumentation of the RAS

The basic ion-optical principles of creation of multiple-reflection time-of-flight high resolution mass analysers for mass measurement and separation of isotopes in nuclear research are given in this report. Ion-optical elements of these analysers such as the short ion pulse forming apparatus based on a linear radio-frequency catcher, gridless axial-symmetrical ion mirrors, power filters, power buncher, mass selective ion catcher as well as the methods and apparatus for the adjustment of time-of-flight focused ion bunch position to detector are under consideration.
Current values of resolution and mass accuracy, basic parameters of multiple-reflection time-of-flight high resolution mass analysers, as well as bulk charge effect on these parameters are discussed.